Whether you would like us to perform the analysis or you would prefer to drive yourself, we have a state‐of‐the‐art Jeol 6010LA scanning electron microscope (SEM) with EDS analysis at your disposal. Examine samples at magnifications up to 20,000x, measure or learn the elements present within a material.
EDS scans and mapping.
Secondary electron and backscatter modes.
Stage can accommodate 3”W x 4”L x 1.5”H samples
Easy to learn and use.
For more details, contact us at firstname.lastname@example.org or (289) 895‐8363.